Abstract

Current LTE/LTE-Advanced standards lack the performance needed to keep up with market demand for higher data throughput, greater cell capacity, and reliability. New 5G cellular standards are being developed to achieve the desired performance goals and to co-exist with 4G technologies. New wireless channels are being considered at frequencies below 6 GHz such as 3.6 and 5 GHz. However, there is very limited spectrum available below 6 GHz, so mmWave frequencies that can incorporate wide-bandwidth transmissions are being investigated for next generation cellular systems. New air interface standards being investigated above 6 GHz include 15, 28, 32, 38, 45, 72 GHz and higher.

The attenuation dramatically increases as the frequency steps into mmWave, and insertion loss (I.L.) becomes higher and higher. In order to compensate the attenuation in the air, the massive MIMO antenna is applied in 5G communication technology. There may be hundreds of channels or test ports in 5G communication test system. The stability of the test system is the most important parameter in order to get accuracy and repeatable test results. However, the stability of the test system may be dominated by cable assemblies. If there is some instability during calibration/test, much time will be wasted to find the root cause with huge cable assemblies. As the test ports increase, the connections have high density. The transitional armored cable assemblies with larger outer diameter (O.D.) will never fit-for-use. However, there is some concern with unarmed cable assemblies in order to get ruggedized solution, and more stable results. Also, the weight of hundreds of cable assemblies is a problem when connecting to the same test system. A 5G test cable assemblies solution is introduced. It's the solution for high-density high-frequency interconnection test, not only for RF and microwave modular applications but also for high-speed digital tests.

Biography

Mr David Zheng

David graduated with bachelor degree of EECS from SouthEast University in 2008. He started his career in Zhiyuan Electronic as a R&D engineer designing logical analyzer and oscilloscope focusing on high-speed digital design and signal integrity. Then, David joined Agilent as an Application Engineer in 2011, focusing on RF & microwave test solutions, supporting component test solutions (eg. VNA, signal analysis, signal generator, impedance analyzer, etc.). David joined Gore in 2014 as a Senior Application Engineer covering AP region, supporting Gore Microwave Cable Assemblies. David has in-depth knowledge on test (RF & microwave components , PCB, cable, etc.) and materials. He is good at signal integrity solutions, helping customers to solve signal chain or test & measurement issues.